| 000 | 00708nam a22001937a 4500 | ||
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| 003 | OSt | ||
| 005 | 20200608140846.0 | ||
| 008 | 200608b mp ||||| |||| 00| 0 mon d | ||
| 040 | _aАнагаах ухааны төв номын сан | ||
| 100 |
_aJoseph I.Goldstein. _940265 |
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| 245 | _aScanning electron Microscopy and X-Ray microanalysis. | ||
| 250 | _a 4-th edition | ||
| 260 |
_bSpringer _c2018 |
||
| 546 | _aEnglish | ||
| 650 |
_aElectron beam, Backscattered & secondary electrons, X-Rays, Scanning, Image formation _940266 |
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| 651 |
_aAnalysis of speciments with special geometry _940267 |
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| 856 |
_uhttps://online.fliphtml5.com/lluzx/jfrq/ _zЦахимаар унших |
||
| 942 |
_2ddc _cEB |
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| 999 |
_c17833 _d17833 |
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