Scanning electron Microscopy and X-Ray microanalysis. (Record no. 17833)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00708nam a22001937a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20200608140846.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 200608b mp ||||| |||| 00| 0 mon d |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | Анагаах ухааны төв номын сан |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Joseph I.Goldstein. |
| 9 (RLIN) | 40265 |
| 245 ## - TITLE STATEMENT | |
| Title | Scanning electron Microscopy and X-Ray microanalysis. |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 4-th edition |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | Springer |
| Date of publication, distribution, etc. | 2018 |
| 546 ## - LANGUAGE NOTE | |
| Хэл | English |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electron beam, Backscattered & secondary electrons, X-Rays, Scanning, Image formation |
| 9 (RLIN) | 40266 |
| 651 ## - SUBJECT ADDED ENTRY--GEOGRAPHIC NAME | |
| Geographic name | Analysis of speciments with special geometry |
| 9 (RLIN) | 40267 |
| 856 ## - Цахимаар унших | |
| Цахимаар унших | <a href="https://online.fliphtml5.com/lluzx/jfrq/">https://online.fliphtml5.com/lluzx/jfrq/</a> |
| Public note | Цахимаар унших |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | Цахим ном |
| Date last seen | Total Checkouts | Price effective from | Koha item type | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Withdrawn status | Home library | Current library | Date acquired |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 06/08/2020 | 06/08/2020 | Цахим ном | Dewey Decimal Classification | Эрдэм шинжилгээний номын сан | Эрдэм шинжилгээний номын сан | 06/08/2020 |